Εξαρτήματα Περιθλασομέτρου ακτίνων Χ( x-ray)

X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.

Data

Inventory Number: 

dem26

Date: 

c.1960

Instrument Categories: 

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